Note
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Kischkat¶
Data for Main / Sio2 / Kischkat
import os
import matplotlib.pyplot as plt
import numpy as np
import refidx as ri
plt.style.use("../../doc/refidx.mplstyle")
db = ri.DataBase()
matid = ['main', 'SiO2', 'Kischkat']
mat = db.get_item(matid)
wr = mat.wavelength_range
lamb = np.linspace(*wr, 1000)
index = mat.get_index(lamb)
fig, ax = plt.subplots(2, 1, figsize=(3, 3))
ax[0].plot(lamb, index.real, "-", color="#aa0044")
ax[1].plot(lamb, index.imag, "-", color="#6886b3")
ax[0].set_xlabel(r"Wavelength ($\rm μm$)")
ax[1].set_xlabel(r"Wavelength ($\rm μm$)")
ax[0].set_ylabel(r"$n^{\prime}$")
ax[1].set_ylabel(r"$n^{\prime\prime}$")
plt.suptitle(mat)
mat.print_info(
html=True,
tmp_dir=os.path.join("..","..", "doc", "auto_gallery","SiO2"),
filename="out_main_SiO2_Kischkat.html",
)
Comments
510-nm single layer on Si substrate. Prepared by room temperature reactive sputter deposition using Si target and 2.0 SCCM O2 flux.
Data on the influence of deposition conditions on the optical properties of the film can be found in the original publication.
Data on the refractive index (n) in the visible can be found in the original publication.
References
J. Kischkat, S. Peters, B. Gruska, M. Semtsiv, M. Chashnikova, M. Klinkmüller, O. Fedosenko, S. Machulik, A. Aleksandrova, G. Monastyrskyi, Y. Flores, and W. T. Masselink. Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride, Appl. Opt. 51, 6789-6798 (2012) (Numerical data kindly provided by Jan Kischkat)
Total running time of the script: (0 minutes 0.395 seconds)
Estimated memory usage: 225 MB