Yim-20nm

Data for Main / Mos2 / Yim-20nm

import os
import matplotlib.pyplot as plt
import numpy as np
import refidx as ri

plt.style.use("../../doc/refidx.mplstyle")
db = ri.DataBase()
matid = ['main', 'MoS2', 'Yim-20nm']
mat = db.get_item(matid)
wr = mat.wavelength_range
lamb = np.linspace(*wr, 1000)
index = mat.get_index(lamb)
fig, ax = plt.subplots(2, 1, figsize=(3, 3))
ax[0].plot(lamb, index.real, "-", color="#aa0044")
ax[1].plot(lamb, index.imag, "-", color="#6886b3")
ax[0].set_xlabel(r"Wavelength ($\rm μm$)")
ax[1].set_xlabel(r"Wavelength ($\rm μm$)")
ax[0].set_ylabel(r"$n^{\prime}$")
ax[1].set_ylabel(r"$n^{\prime\prime}$")
plt.suptitle(mat)
mat.print_info(
    html=True,
    tmp_dir=os.path.join("..","..", "doc", "auto_gallery","MoS2"),
    filename="out_main_MoS2_Yim_20nm.html",
)

Comments

19.88 nm film synthesized by vapor phase sulfurization. ~290 nm thick SiO₂ substrate thermally grown on <100> oriented crystalline Si wafer.

References

C. Yim, M. O'Brien, N. McEvoy, S. Winters, I. Mirza, J. G. Lunney and G. S. Duesberg. Investigation of the optical properties of MoS₂ thin films using spectroscopic ellipsometry, Appl. Phys. Let. 104, 103114 (2014)

Estimated memory usage: 225 MB