Ciesielski-20nm

Data for Main / Ge / Ciesielski-20nm

import os
import matplotlib.pyplot as plt
import numpy as np
import refidx as ri

plt.style.use("../../doc/refidx.mplstyle")
db = ri.DataBase()
matid = ['main', 'Ge', 'Ciesielski-20nm']
mat = db.get_item(matid)
wr = mat.wavelength_range
lamb = np.linspace(*wr, 1000)
index = mat.get_index(lamb)
fig, ax = plt.subplots(2, 1, figsize=(3, 3))
ax[0].plot(lamb, index.real, "-", color="#aa0044")
ax[1].plot(lamb, index.imag, "-", color="#6886b3")
ax[0].set_xlabel(r"Wavelength ($\rm μm$)")
ax[1].set_xlabel(r"Wavelength ($\rm μm$)")
ax[0].set_ylabel(r"$n^{\prime}$")
ax[1].set_ylabel(r"$n^{\prime\prime}$")
plt.suptitle(mat)
mat.print_info(
    html=True,
    tmp_dir=os.path.join("..","..", "doc", "auto_gallery","Ge"),
    filename="out_main_Ge_Ciesielski_20nm.html",
)

Comments

20 nm-thick germanium film deposited directly on SiO₂ substrate

References

A. Ciesielski, L. Skowronski, W.Pacuski, T. Szoplik. Permittivity of Ge, Te and Se thin films in the 200–1500 nm spectral range. Predicting the segregation effects in silver, Mat. Sci. Semicond. Process. 81, 64-67 (2018) (Numerical data kindly provided by Arkadiusz Ciesielski)

Estimated memory usage: 225 MB